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In-situ Scanning Transmission Electron Microscopy Study on the Microstructural Characterization of a TFT-LCD Panel by a FIB/SEM
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- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 1020-1021
- Print publication:
- August 2008
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A Study on Phase Separation in InGaN/GaN Multi-quantum Wells
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- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 750-751
- Print publication:
- August 2006
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- Article
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